PUBLICATION

PUBLICATION PUBLICATION

PUBLICATION

Hysteresis caused by defects in buffer layer of metal-ferroelectric-i…

작성자최고관리자

  • 등록일 25-05-20
  • 조회20회
  • 이름최고관리자

본문

Hysteresis caused by defects in buffer layer of metal-ferroelectric-insulator-semiconductor (MFIS) devices

첨부파일